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FLAWLESS TEAMING FOR NEW HEIGHT OF YIELD PERFORMANCE

Total Solution

PCell Design Tool
SMTX PCell design tool has the capacity to create any kind of PCells and layouts for foundries, design houses and IDMs, improving design efficiency at least 10X.
Improve design efficiency Rich built-in PCell library
Testchip Design Tool
SMTX testchip design tool provides a complete and smart solution for test chip design during the whole technology life cycle. It offers highly automatic layout creation, placing and routing, design documentation and testing program generation on one unified platform.
Easy to achieve error-free layout design Auto documentation
Throughput Improvement
(Tester only compared to baseline)
1.4X-5X
Throughput Improvement
(Tester + IP Synergy)
3X-1000X
Tester Solution
High Speed Wafer-Level Parametric Tester combined with Advanced Process Control Monitor IP, achieving a breakthrough in parametric testing throughput and process monitoring efficiency.
• High accuracy, high throughput and high efficiency of WAT/WLR electrical parameters monitoring for high quality mass production.
• High flexibility and highly parallel pins testing to meet R&D needs.
Advanced PCM IP Higher Efficiency Design Wafer Level Parametric TesterHigher Throughput & Accuracy

Overview

At SMTX, we are dedicated to driving innovation and excellence in the semiconductor industry. Based in the dynamic hub of Singapore, we specialize in the trade of top-tier Yield Enhancement EDA tools and Wafer Acceptance Test (WAT) equipment. With a deep understanding of the semiconductor landscape, SMTX offer a comprehensive range of products that cater to the unique needs of our clients. SMTX mission is to empower semiconductor manufacturers with the advanced technology and solutions they need to achieve superior product quality and operational efficiency.

Advantages

PERFORMANCE
Current Sensing Accuracy: sub-pA
Voltage Sensing Accuracy: 0.1mV
Capacitance Accuracy: <0.01pF
WPH improvement: 1.4X-5X
SOFTWARE
Algorithm Builder: easy to edit and debug
Test Plan Editor: supports template
Frame Work: flexible alarm and low yield handling
AUTOMATION
Support all common probers
Support EAP GEM 300
Support all standard protocols: E5 E30 E37 E39 E40 E87 E90 E94 E84, etc.
Main Features
Provide accurate and high-speed solutions for better process monitoring
Support two operation modes - online and offline
Enable engineers to easily update test plans based on previous test results
Provide utilities to directly control prober movements
Cover all the WAT items: MOSFETs (Id, Vt, Ioff…), BJT, diode (breakdown), resistors, capacitors, etc.
Cover WLR items: HCI, BTI, TDDB, EM etc.
Optimized software and hardware designs to achieve accurate, fast and stable testing

Technical Specifications

Contact Us

  • If you have any questions and suggestions, please leave a message online, we will contact you as soon as possible
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